Matthew Kirk
Thoughtful Machine Learning: A Test-Driven Approach
- ISBN 13:
- 9781449374068
- author:
- Matthew Kirk
- format:
- Paperback
- publisher:
- OReilly Media
- language:
- English
- Publication Year:
- 2014
- Pages:
- 236
- Dimensions:
- 17.8 x 1.4 x 23.3 cm
- Genre:
- Computing & Internet, Computer Science, Architecture & Microprocessors
- Condition:
- New
- Availability:
- Item usually sent within 10 working days
Description
Learn how to apply test-driven development (TDD) to machine-learning algorithms and catch mistakes that could sink your analysis. In this practical guide, Matthew Kirk shows you how to apply TDD principles to several machine-learning algorithms, including Naive Bayesian classifiers and Neural Networks. By applying TDD, you can write clean, stable machine-learning code and mitigate the risk of errors. You'll learn about the best uses and tradeoffs of eight machine learning algorithms, using real-world examples to test each algorithm through engaging, hands-on exercises. You'll also understand the similarities between TDD and the scientific method for validating solutions, be aware of the risks of machine learning such as underfitting and overfitting data, and explore techniques for improving your machine-learning models or data extraction.
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